UNIUS Ultrasonic Equipment

Situation

The high precision and longevity of technical components such as vessels, piping systems, turbine shafts, and vehicles in the automotive and aviation industry, is achieved in part by routinely performed preventative in-service inspections (ISI), preferably using non-destructive testing (NDT).

Powerful and intelligent ultrasonic testing systems are indispensable for ISI inspections. These systems should be usable for stationary, in situ applications and must be suited to the individual inspection task to ensure high inspection standards. In addition, they must be easy and quick to setup and use.

Solution

We provide standard and custom-designed ultrasonic equipment and components for a large variety of testing applications.

Fraunhofer IZFP's latest development UNIUS, a single channel ultrasonic Pulser/Receiver (P/R) Board can be easily integrated by ITK Software in customer GUI.

Q NET also provides UNIUS P/R Boards already integrated in ruggedized Notebooks for rough industrial environment which can easily be adopted to the customer's needs.

The receiver has ≥ 100 dB gain range and 0.1 dB resolution with 0.5 - 20 MHz bandwidth. The pulser is negative square wave 0-300V. For more details see section Technical Data.

Leeb Hardness Tester

Technical Data

Pulser

Number of transmitter channels 1
Pulse shape Negative square wave
Pulse width 30 ns to 800 ns, adjustable in steps of 12.5 ns
Pulse rise time ± 2 ns (10% to 90% amplitude)
Pulse fall time 20 ns ± 5 ns(90% to 10% amplitude)
Pulse delay 0 ns to 17.89 s, resolution 4,17 ns
Transmitter voltage Internal power supply: 0 V to 300 V programmable in 256 (1.17V) steps
External power supply: up to 800V possible
Transmitter output impedance 50 Ω, 300 Ω selectable by jumper
Pulse repetition frequency ≤ 15 kHz [300 Ω, 50 ns pulse width, N23 ultrasonic reference standard] 
dependent on pulse width, pulse voltage, sampling rate, measurement range

Receiver

Number of receiver channels 1 (one connected to pulser [IE] and one separated [SE])
Receiver input impedance 50 Ω, 300 Ω selectable by jumper
Min. input sensitivity 100 µVss
Max. input signal 10 Vss
Input dynamic range ≥100 dB
Receiver characteristic Linear
Gain range ≥100 dB, resolution 0.1 dB
TGC (Time gain control)
Distance amplitude correction
up to 256 values, equidistant time steps, min. time step width 1 µs; the usable range is full range minus gain;
Receiver bandwidth 0.5 MHz - 20 MHz (-3 dB range)
Filter 4 analog filters, fix
1 MHz (0.5 MHz – 2 MHz) / 2 MHz (1.2 MHz – 3 MHz)
4 MHz (3.2 MHz – 5.4 MHz) / 10 MHz (6 MHz – 14 MHz) / Bypass
Optional 3 additional analog filters, pluggable
Operating modes IE, SE
Receiver delay 0 ns to 17.89 s , resolution 4.17 ns

Digital Section

A/D converter resolution 14 Bit (13 Bit + sign)
Dynamic range A/D converter ≤ 70 dB
A/D sampling rate 240 MS/s
Time span resolution 12,5 ns
Pulse fall time 20 ns ± 5 ns(90% to 10% amplitude)
Acquisition delay 0 - 53 s (32 bit)
Memory Max. 128 k Samples (546 ìs at 240 MHz;1092 ìs at 120 MHz;
1638 ìs at 80 MHz; etc.)

Data acquisition modes

Echo start gate (US_0) 0 – 53 s, resolution 12.5 ns
(US_0 = surface) Mode: threshold exceeding / gate end or fixed probe delay
0 – 53 s, resolution 12.5 ns
RF-Data Number of ranges: 1
Measurement range: 546 ìs – 34,9 ms, dependent on ADC-Sampling rate (scaling factor 1 - 64)
Start measurement range: US_0 to 53 s, resolution 12.5 ns
Data format: 16 Bit words (14Bit ADC-Data + overflow)
Average Average of 2, 4, … 512 measurement results with pseudo random or fix time delay

Optional: Data acquisition modes Implementation on request

Gates Number of gates: 4 (overlap allowed)
Measurement range: US_0 to 53 s, resolution 12.5 ns
Data format: 16 Bit words (14Bit ADC-Data + threshold exceeding, 16 Bit runtime, resolution 12.5ns)
A-Scan Number of ranges: 1
Sampling depth: 125, 250, 500, 1000 Pixel
Sampling start: US_0 / SAP
Measurement range: dependent on sampling depth and scaling factor (1-255)
Data format: 16 Bit words (14Bit ADC-Data + Overflow)
TD-Scan Number of ranges: 1
Sampling depth: dependent on sampling depth of the HF-Signal
Sampling start: dependent on sampling start of the HF-Signal
Measurement range: dependent on sampling depth, sampling-rate of the HF-Signal and the scaling factor (2-256)
Data format: 16 Bit words (14Bit ADC-Data+ Overflow)
Average Average of 2, 4, … 512 measurement results with pseudo random or fix time delay

Inputs / Outputs

Trigger input Coded CTP-trigger from coordinates unit,
LVTTL, H- or L- active, pulse width > 100 ns
Digital I/O 5 Input and 5 Output with ground
Extension connector I/Os for possible extension boards
Communication and data USB 3.0, standard Fiber- Optic interface on request (1500 Mbit)

Miscellaneous

Operating temperature 5°C to 50°C
Form factor PCI Short Card (174 x 106,689) only mechanical support,
Height of component side is with 20 mm out of PCI specification.
Power supply from external connector.
Additional mounting holes for stand-alone applications.
Power supply 12V DC, approx. 1,1 A (≤ 13,2 W)

WRITE TO US

CONTACT US

Quality Network Pvt Ltd.

Works

No. 10, II Cross Street, Kalaimagal Nagar,
Ekkattuthangal, Chennai - 600032 

Registered Address

#38/GA, Shoreham, 5th Avenue, Besant Nagar, 
Chennai – 600 090

Phone: +91 44 4857 5263
Mob: +91 9444979858

Emailqnet.india@gmail.cominfo@qnetindia.com

NETWORK

USA - Quality Network Inc.

11 Main Street
Sparta, NJ 07871-1979

Phone: +01 (973) 726-8399
Mobile: +01 (973) 699-4460

Email: md@qnetworld.com
Web: www.qnetworld.com

Visitors professional logo

Copyright © 2019 - 2020 Quality Network India Pvt Ltd.